|Authors/others:||Susi, Toma; Meyer, Jannik C.; Kotakoski, Jani|
Recent advances in scanning transmission electron microscopy (STEM) instrumentation have made it possible to focus electron beams with sub-atomic precision and to identify the chemical structure of materials at the level of individual atoms. Here we discuss the dynamics that are observed in the structure of low-dimensional materials under electron irradiation, and the potential use of electron beams for single-atom manipulation. As a demonstration of the latter capability, we show how momentum transfer from the electrons of a 60-keV Ångström-sized STEM probe can be used to move silicon atoms embedded in the graphene lattice with atomic precision.
|Date of publication:||2.3.2017|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1016/j.ultramic.2017.03.005|
|State:||E-pub ahead of print|