Manipulating low-dimensional materials down to the level of single atoms with electron irradiation

Authors/others:Susi, Toma; Meyer, Jannik C.; Kotakoski, Jani
Abstract:

Recent advances in scanning transmission electron microscopy (STEM) instrumentation have made it possible to focus electron beams with sub-atomic precision and to identify the chemical structure of materials at the level of individual atoms. Here we discuss the dynamics that are observed in the structure of low-dimensional materials under electron irradiation, and the potential use of electron beams for single-atom manipulation. As a demonstration of the latter capability, we show how momentum transfer from the electrons of a 60-keV Ångström-sized STEM probe can be used to move silicon atoms embedded in the graphene lattice with atomic precision.

Language:English
Date of publication:2.3.2017
Journal title:Ultramicroscopy
Peer reviewed:true
Links:
Digital Object Identifier (DOI):http://dx.doi.org/10.1016/j.ultramic.2017.03.005
Publication Type:Article
State:E-pub ahead of print
Portal:https://ucris.univie.ac.at/portal/en/publications/manipulating-lowdimensional-materials-down-to-the-level-of-single-atoms-with-electron-irradiation(007a10cc-ce90-4d97-8401-7a2f5cdef517).html